author:Sachdev, Manoj | カーリル

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

Malaiya, Yashwant K.／Sachdev, Manoj／Menon, Sankaran M.／IEEE VLSI Test Symposium (2000 : Montreal, Quebec)

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Defect oriented testing for CMOS analog and digital circuits

by Manoj Sachdev

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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

Andrei Pavlov, Manoj Sachdev

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Thermal and power management of integrated circuits

Arman Vassighi and Manoj Sachdev

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ESD protection device and circuit design for advanced CMOS technologies

Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev

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Defect-oriented testing for nano-metric CMOS VLSI circuits

by Manoj Sachdev and José Pineda de Gyvez

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