Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)

出版社: Springer(2007-06-21)

ハードカバー: 349 ページ / 16.2 x 1.9 x 23.6 cm

ISBN-10: 0387465464  ISBN-13: 9780387465463