author:Khosla, Rajinder P.

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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Albany, New York, 11-15 May 2009 (AIP Conference Proceedings (Numbered))

Seiler, David G／Diebold, Alain C／McDonald, Robert／Garner, C Michael／Herr, Dan／Khosla, Rajinder P

Characterization And Metrology for Ulsi Technology 2005 (Aip Conference Proceedings)

Seiler, David G.／Diebold, Alain C.／McDonald, Robert／Ayre, Caroline R.／Khosla, Rajinder P.

High-Resolution Sensors and Hybrid Systems: 10-14 February 1992 San Jose, California (Proceedings of Spie)

Blouke, Morley M.／Chang, Win-Chyi／Khosla, Rajinder P.

Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003 (Aip Conference Proceedings)

Seiler, David G.／Diebold, Alain C.／Shaffner, T. J.／McDonald, Robert／Zollner, Stefan／INTERNATIONAL CONFERENCE ON CHARACTERIZA／Diebold, Alain C.／Shaffner, T. J.／McDonald, Robert／Zollner, Stefan／Khosla, Rajinder P.／Secula, Eric M.／Seiler, David G.