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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Albany, New York, 11-15 May 2009 (AIP Conference Proceedings (Numbered))
詳しい情報
出版社: American Institute of Physics(2009-10-26)
ハードカバー: 398 ページ / 22.1 x 2.8 x 27.7 cm
ISBN-10: 0735407126 ISBN-13: 9780735407121