author:Khosla, Rajinder P.

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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Albany, New York, 11-15 May 2009 (AIP Conference Proceedings (Numbered))

Seiler, David G／Diebold, Alain C／McDonald, Robert／Garner, C Michael／Herr, Dan／Khosla, Rajinder P

Characterization And Metrology for Ulsi Technology 2005 (Aip Conference Proceedings)

Seiler, David G.／Diebold, Alain C.／McDonald, Robert／Ayre, Caroline R.／Khosla, Rajinder P.

High-Resolution Sensors and Hybrid Systems: 10-14 February 1992 San Jose, California (Proceedings of Spie)

Blouke, Morley M.／Chang, Win-Chyi／Khosla, Rajinder P.

Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003 (Aip Conference Proceedings)

Seiler, David G.／Diebold, Alain C.／Shaffner, T. J.／McDonald, Robert／Zollner, Stefan／INTERNATIONAL CONFERENCE ON CHARACTERIZA／Diebold, Alain C.／Shaffner, T. J.／McDonald, Robert／Zollner, Stefan／Khosla, Rajinder P.／Secula, Eric M.／Seiler, David G.

Administrative Structure of the Great Mughals

Khosla, Rajinder P.