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Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts
John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]
Deadly lessons : understanding lethal school violence : case studies of School Violence Committee
Mark H. Moore ... [et al.], editors ; Committee on Law and Justice and Board on Children, Youth, and Families, Division of Behavioral and Social Sciences and Education, National Research Council and Institute of Medicine