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Proceedings of the International Conference on Quantitative Genetics, August 16-21, 1976

edited by Edward Pollak, Oscar Kempthorne and Theodore B. Bailey, Jr.

Personal insolvency : law and practice

Stephen Schaw Miller, Edward Bailey ; with assistance from Tim Akkouh, Emily Gillett

Arco preparation for the SAT, scholastic aptitude test

general editor, Edward J. Deptula ; contributing editors, Gabriel P. Freedman, Brigitte Saunders, Robert L. Bailey

Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas

M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology

Microelectronic structures and microelectromechanical devices for optical processing and multimedia applications : 24 October, 1995, Austin, Texas

Wayne Bailey, M. Edward Motamedi, Fang-Chen Luo, chairs/editors ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--the International Society for Optical Engineering