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Machine vision handbook
Bruce G. Batchelor (ed.)
Pattern recognition : ideas in practice
edited by Bruce G. Batchelor
Machine vision systems integration in industry : 8-9 November 1990, Boston, Massachusetts
Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Machine vision applications, architectures, and systems integration : 17-18 November 1992, Boston, Massachusetts
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering
Machine vision applications, architectures, and systems integration V : 18-19 November 1996, Boston, Massachusetts
Susan S. Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Machine vision applications, architectures, and systems integration IV : 23-24 October, 1995, Philadelphia, Pennsylvania
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Machine vision applications, architectures, and systems integration III : 31 October-2 November 1994, Boston, Massachusetts
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Machine vision architectures, integration, and applications : 12-15 November 1991, Boston, Massachusetts
Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts
John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering