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Materials Reliability in Microelectronics VIII: Volume 516 (MRS Proceedings)
Bravman, John C./Marieb, Thomas N./Lloyd, James R./Korhonen, Matt A.
Thin Films:: Volume 130: Stresses and Mechanical Properties I (MRS Proceedings)
Bravman, John C./Nix, William D./Barnett, David M./Smith, David A.
Annual Review of Materials Research 2008
Thomas, John M./Gai, Pratibha L./Clarke, David R./Ruhle, Manfred/Bravman, John C.
Annual Review of Materials Research 2007
Thomas, John M./Gai, Pratibha L./Clarke, David R./Ruhle, Manfred/Bravman, John C.
Annual Review of Materials Research 2006 (ANNUAL REVIEW OF MATERIALS RESEARCH 2004)
Thomas, John M./Gai, Pratibha L./Clarke, David R./Ruhle, Manfred/Bravman, John C.
Annual Review of Materials Research 2005 (ANNUAL REVIEW OF MATERIALS RESEARCH 2004)
Thomas, John M./Gai, Pratibha L./Clarke, David R./Ruhle, Manfred/Bravman, John C.
Annual Review of Materials Research (ANNUAL REVIEW OF MATERIALS RESEARCH 2004)
Hu, Evelyn/Clarke, David R./Ruhle, Manfred/Bravman, John C.
Annual Review of Materials Science: 2003 (Annual Review of Materials Research)
Kreuer, Kaus-Dieter/Clarke, David R./Ruhle, Manfred/Bravman, John C.