author:National Institute of Standards and Technology (U. S.)

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Guide to Industrial Control Systems Security

U.s. Department of Commerce／National Institute of Standards and Technology

Davis, William D.／Barowy, Adam M.／Kerber, Stephen／U.s. Department of Commerce National Institute of Standards and Technology (Nist)

Guidelines on Firewalls and Firewall Policy (Nist Special Publication 800-41 Ision 1)

Scarfone, Karen／Hoffman, Paul／U.s. Department of Commerce National Institute of Standards and Technology

Compilation of Nist Higher-Order Methods for the Determination of Electrolytes in Clinical Materials

Long, Stephen E.／Murphy, Karen E.／U.s. Department of Commerce National Institute of Standards and Technology

Comparison of Fire Sprinkler Piping Materials: Steel, Copper, Chlorinated Polyvinyl Chloride and Polybutylene, in Residential and Light Hazard Installations

Notarianni, Kathy A.／Jackson, Margaret A.／National Institute of Standards and Technology／U.s. Fire Administration

Latent Print Examination and Human Factors: Improving the Practice Through a Systems Approach

U.s. Department of Commerce／National Institute of Standards and Technology／National Institute of Justice／Law Enforcement Standards Office

Recommendation for the Triple Data Encryption Algorithm Tdea Block Cipher: Nist Special Publication 800-67, Revision 2

Barker, William C.／Barker, Elaine／U.s. Department of Commerce／National Institute of Standards and Technology

Secure Hash Standard: Federal Information Processing Standards Publication 180-4

U.s. Department of Commerce／National Institute of Standards and Technology／Dang, Q. H.

Micromachined Devices and Components 23 24 October 1995: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2642.)

Roop, Ray／Chau, Kevin／Semiconductor Equipment and Materials International／Society of Photo-Optical Instrumentation Engineers／National Institute of Standards and Technology (U. S.)

Advanced surface engineering

edited by William D. Sproul and Keith O. Legg ; prepared for U.S. Department of Commerce, National Institute of Standards and Technology