Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices (Defect and Diffusion Forum, Volume 426)

出版社: Trans Tech Publications Ltd(2023-07-06)

ペーパーバック: 152 ページ / 17.0 x 0.8 x 24.0 cm

ISBN-10: 3036403329  ISBN-13: 9783036403328