Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III: 19-20 July 1999, Denver, Colorado (Proceedings of Spie--The International Society for Optical Engineering, V. 3764.)
詳しい情報
出版社: Society of Photo Optical(1999-10-01)
ペーパーバック: 288 ページ
ISBN-10: 0819432504 ISBN-13: 9780819432506