Three-Dimensional Imaging, Optical Metrology, and Inspection IV: 2-3 November, 1998, Boston, Massachusetts (Proceedings of Spie--The International Society for Optical Engineering, V. 3520.)
詳しい情報
出版社: Society of Photo Optical(1998-12-01)
ペーパーバック: 304 ページ / 21.0 x 1.9 x 26.7 cm
ISBN-10: 0819429813 ISBN-13: 9780819429810